Li, Y. -Q.; Wang, H. -B.; Liu, R.; Chen, L.; Nofal, I.; Shi, S. -T.; He, A. -L; Guo, G.; Baeg, S. H.; Wen, S. -J., et al.
ArticleIssue Date2017CitationIEEE TRANSACTIONS ON NUCLEAR SCIENCE, v.64, no.6, pp.1554 - 1561PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC