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ALD 장비의 Al2O3 공정 안정화를 위한 저온 트랩 장치의 특성 평가Characterizations of a Cold Trap System for the Process Stabilization of Al2O3 by ALD Equipment

Other Titles
Characterizations of a Cold Trap System for the Process Stabilization of Al2O3 by ALD Equipment
Authors
권상직서용혁이원우김인환한지은이연주조재효전용민조의식
Issue Date
Mar-2024
Publisher
한국반도체디스플레이기술학회
Keywords
Atomic Layer Depositon (ALD); Thin Film Encapsulation (TFE); Al2O3; Cold trap; by-product; Al-O
Citation
반도체디스플레이기술학회지, v.23, no.1, pp 92 - 96
Pages
5
Journal Title
반도체디스플레이기술학회지
Volume
23
Number
1
Start Page
92
End Page
96
URI
https://scholarworks.bwise.kr/gachon/handle/2020.sw.gachon/91356
ISSN
1738-2270
Abstract
The application of the technology for forming Al2O3 thin films using ALD(atomic layer deposition) method is rapidly increasing in the semiconductor and display fields. In order to increase the efficiency of the ALD process in a mass production line, metallic by-products generated from the ALD process chamber must be effectively collected. By collecting by-products flowing out of the chamber with a cold trap device before they go to the vacuum pump, damage to the vacuum pump can be prevented and the work room can be maintained stably, resulting in increased process flow rate. In this study, a cold trap was installed between the ALD process chamber and the dry pump to measure and analyze by-products generated during the Al2O3 thin film deposition process. As a result, it was confirmed that Al and O elements were discharged, and the collection forms were two types: bulk and powder. And the binding energy peaked at 73.7 ~ 74.3 eV, the binding energy of Al 2p, and 530.7 eV, the binding energy of O 1s, indicating that the binding structure was Al-O.
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