ScholarWorks@Hanyang University: Browsing ScholarWorks

Browsing by Kim, JeonghanAuthor

All A B C D E F G H I J K L M N O P Q R S T U V W X Y Z

전체 가 나 다 라 마 바 사 아 자 차 카 타 파 하

Sort by: In order: Results/Page Authors/Record:

Showing results 1 to 8 of 8

SCIESCOPUS

All-Sputter-Deposited Hf0.5Zr0.5O2 Double-Gate Ferroelectric Thin-Film Transistor With Amorphous Indium-Gallium-Zinc Oxide Channel Go to Link

Jeong, Soi; Han, Changhyeon; Yim, Jiyong; Kim, Jeonghan; Kwon, Ki Ryun; Kim, Sangwoo; Park, Eun Chan; You, Ji Won; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2023CitationIEEE ELECTRON DEVICE LETTERS, v.44, no.5, pp.749 - 752PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Corrigendum to “Effects of oxygen vacancies on ferroelectric characteristics of RF-sputtered Hf0.5Zr0.5O2” [Mater. Sci. Semicond. Process. 160 (2023) 107401] (Materials Science in Semiconductor Processing (2023) 160, (S136980012300094X), (10.1016/j.mssp.2023.107401))Go to Link

Han, Changhyeon; Kwon, Ki Ryun; Kim, Jeonghan; Yim, Jiyong; Kim, Sangwoo; Park, Eun Chan; You, Ji Won; Jeong, Soi; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2023CitationMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.160, pp.1 - 1PublisherELSEVIER SCI LTD

SCIESCOPUS

Effects of Deposition Power and Thermal Treatment on Ferroelectric Properties of Sputtered Hf₀.₅Zr₀.₅O₂ Go to Link

Han, Changhyeon; Kwon, Ki Ryun; Yim, Jiyong; Kim, Jeonghan; Kim, Sangwoo; Jeong, Soi; Park, Eun Chan; You, Ji Won; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2024CitationIEEE Transactions on Electron Devices, v.71, no.5, pp 3130 - 3134PublisherInstitute of Electrical and Electronics Engineers

SCIESCOPUS

Effects of oxygen vacancies on ferroelectric characteristics of RF-sputtered Hf0.5Zr0.5O2 Go to Link

Han, Changhyeon; Kwon, Ki Ryun; Kim, Jeonghan; Yim, Jiyong; Kim, Sangwoo; Park, Eun Chan; You, Ji Won; Jeong, Soi; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2023CitationMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.160, pp.1 - 8PublisherELSEVIER SCI LTD

SCIESCOPUS

Ferroelectric Field-Effect Transistor Synaptic Device With Hafnium-Silicate Interlayer Go to Link

Kim, Sang Woo; Shin, Wonjun; Kim, Munhyeon; Kwon, Ki Ryun; Yim, Jiyong; Kim, Jeonghan; Han, Changhyeon; Jeong, Soi; Park, Eun Chan; You, Ji Won, et al.

ArticleIssue Date2023CitationIEEE Electron Device Letters, v.44, no.12, pp 1955 - 1958PublisherInstitute of Electrical and Electronics Engineers

SCIESCOPUS

Fume generation behaviors in short circuit mode during gas metal arc welding and flux cored arc welding Go to Link

Chae, Hyunbyung; Kim, Cheolhee; Kim, Jeonghan; Rhee, Sehun

ArticleIssue Date2006CitationMaterials Transactions, v.47, no.7, pp 1859 - 1863PublisherJapan Institute of Metals

SCIESCOPUS

Mesoporous-silica-glazed LCST-type smart windows for saving heating and cooling energy in winter and summer Go to Link

Kwean, Hyerin; Kim, Tae-min; Lee, Heon-ju; Yoo, Jeong-eun; Choi, Min-ju; Kim, Jeonghan; Cho, Eun-chul

ArticleIssue Date2026CitationSurfaces and Interfaces, v.83, pp 1 - 11PublisherElsevier B.V.

SCIESCOPUS

Relationship between the weldability and the process parameters for laser-TIG hybrid welding of galvanized steel sheets Go to Link

Kim, Cheolhee; Choi, Woongyong; Kim, Jeonghan; Rhee, Sehun

ArticleIssue Date2008CitationMaterials Transactions, v.49, no.1, pp 179 - 186PublisherJapan Institute of Metals

RSS_1.0 RSS_2.0 ATOM_1.0

222, Wangsimni-ro, Seongdong-gu, Seoul, 04763, Korea+82-2-2220-1366

Certain data included herein are derived from the © Web of Science of Clarivate Analytics. All rights reserved.
You may not copy or re-distribute this material in whole or in part without the prior written consent of Clarivate Analytics.

Browsing by Kim, JeonghanAuthor

BROWSE