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SCIESCOPUS
A novel observation of negative differential resistance in a standard CMOS transistor and its application to a compact frequency doublerGo to Linkopen access

Kwak, Been; Cho, Youngchan; Han, Changhyeon; Lee, Jongwoo; Kim, Sangwan; Shin, Yunho; Choi, Joonhyeok; Kim, Dongbin; Lee, Seung June; Lee, Seunghoo, et al.

ArticleIssue Date2026CitationMICROSYSTEMS & NANOENGINEERING, v.12, no.1, pp 1 - 14PublisherSPRINGERNATURE
SCIESCOPUS
Degradation and Recovery in HZO-Based FeFETs under Hydrogen and Thermal Stress for CMOS IntegrationGo to Link

Han, Changhyeon; Kwak, Been; Yoo, Yelin; Kwak, Sangeun; Kwon, Daewoong

ArticleIssue Date2026CitationACS Applied Electronic Materials, v.8, no.3, pp 1173 - 1180PublisherAmerican Chemical Society
SCIESCOPUS
Demonstration of Ferroelectric-Gate Field-Effect Transistors with Recessed ChannelsGo to Link

Lee, Kitae; Kwak, Been; Kim, Sihyun; Kwon, Daewoong

ArticleIssue Date2024CitationIEEE Electron Device Letters, v.45, no.2, pp 180 - 183PublisherInstitute of Electrical and Electronics Engineers
SCIESCOPUS
Direct Observation of Conduction Mechanism in Te-Based Selector-Only Memory via Low-Frequency Noise CharacterizationGo to Link

Kim, Dongbin; Choi, Joonhyeok; Seo, Hyun Kyu; Lee, Seung June; Kwak, Been; Kim, Hyun-Min; Park, Min Hyuk; Kang, Youngho; Yang, Min Kyu; Kwon, Daewoong

ArticleIssue Date2026CitationNANO LETTERS, v.26, no.24, pp 7882 - 7890PublisherAMER CHEMICAL SOC
SCIESCOPUS
Effects of temperature and DC cycling stress on resistive switching mechanisms in hafnia-based ferroelectric tunnel junctionGo to Link

Shin, Wonjun; Koo, Ryun-Han; Min, Kyung Kyu; Kwak, Been; Kwon, Dongseok; Kwon, Daewoong; Lee, Jong-Ho

ArticleIssue Date2023CitationApplied Physics Letters, v.122, no.15, pp 1 - 6PublisherAmerican Institute of Physics
SCOPUSESCI
High-density 3D-NAND flash with dual-string select line (D-SSL)Go to Linkopen access

Kwak, Been; Kwon, Daewoong; Yun, Jang-Gn

ArticleIssue Date2024CitationEngineering Research Express, v.6, no.3, pp 1 - 8PublisherIoP Institute of Physics
SCIESCOPUS
In Materia Shaping of Randomness with a Standard Complementary Metal-Oxide-Semiconductor Transistor for Task-Adaptive Entropy GenerationGo to Linkopen access

Kwak, Been; Koo, Ryun-Han; Cho, Youngchan; Han, Changhyeon; Kim, Dongbin; Jeong, Soi; Shin, Yunho; Choi, Joonhyeok; Im, Jiseong; Ko, Jonghyun, et al.

ArticleIssue Date2026CitationADVANCED FUNCTIONAL MATERIALS, v.36, no.23, pp 1 - 14PublisherWILEY-V C H VERLAG GMBH
SCIESCOPUS
Interface-Engineered TiO2 Interlayer for Reliable Hafnia-Based MFMIS FeFETsGo to Linkopen access

Han, Changhyeon; Kwak, Been; Kim, Hyun-min; Yu, Dahye; Kwon, Daewoong

ArticleIssue Date2026CitationADVANCED ELECTRONIC MATERIALS, v.12, no.4, pp 1 - 12PublisherWILEY
SCIESCOPUS
Low-Frequency Noise Characteristics of Recessed Channel Ferroelectric Field-Effect TransistorsGo to Link

Kwak, Been; Kim, Jangsaeng; Lee, Kitae; Shin, Wonjun; Kwon, Daewoong

ArticleIssue Date2024CitationIEEE Electron Device Letters, v.45, no.11, pp 2118 - 2121PublisherInstitute of Electrical and Electronics Engineers
SCIESCOPUS
Low-Frequency Noise Spectroscopy for Navigating Geometrically Varying Strain Effects in HfO2 Ferroelectric FETsGo to Linkopen access

Koo, Ryun-Han; Shin, Wonjun; Kim, Sangwoo; Kim, Jangsaeng; Kwak, Been; Im, Jiseong; Kim, Hyunwoo; Kwon, Deok-Hwang; Cheema, Suraj S.; Lee, Jong-Ho, et al.

ArticleIssue Date2025CitationAdvanced Science, v.12, no.23, pp 1 - 12PublisherWiley-VCH Verlag
SCIESCOPUS
Memory Window Expansion in HfO2-Based FeFETs Through Trap-to-Dipole ConversionGo to Link

Han, Changhyeon; Kwak, Been; Kim, Hyun-Min; Kwak, Sangeun; Kwon, Daewoong

ArticleIssue Date2026CitationIEEE ELECTRON DEVICE LETTERS, v.47, no.5, pp 905 - 908PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Optimizing Reliability: Suppressing Wake-Up Effects in Morphotropic Phase Boundary-Engineered Hf x Zr1-x O2 FerroelectricsGo to Link

Han, Changhyeon; Kwak, Been; Choi, Joonhyeok; Jeong, Woojung; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2025CitationACS Applied Electronic Materials, v.7, no.13, pp 6027 - 6032PublisherAMER CHEMICAL SOC
SCIESCOPUS
Physics-Based α-IGZO TFTs Compact Modeling and Neural Network Application with 2T0C DRAM CellGo to Linkopen access

Kim, Hyoungsoo; Park, Eunchan; Kwak, Been; Kwon, Daewoong; Kim, Hyunwoo

ArticleIssue Date2025CitationIEEE ACCESS, v.13, pp 158751 - 158762PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Repurposing Si CMOS nonidealities for stochastic and analog image processingGo to Linkopen access

Kwak, Been; Koo, Ryun-Han; Han, Changhyeon; Shin, Yunho; Choi, Joonhyeok; Kim, Dongbin; Lee, Jongwoo; Im, Jiseong; Cho, Youngchan; Lee, Jong-Ho, et al.

ArticleIssue Date2026CitationSCIENCE ADVANCES, v.12, no.8, pp 1 - 11PublisherAMER ASSOC ADVANCEMENT SCIENCE
SCIESCOPUS
Signal-Processing Application Based on Ferroelectric Tunnel Field-Effect TransistorGo to Link

Kwak, Been; Kwon, Daewoong; Kim, Hyunwoo

ArticleIssue Date2024CitationIEEE Transactions on Nanotechnology, v.23, pp 562 - 566PublisherInstitute of Electrical and Electronics Engineers
SCIESCOPUS
Structure-modulated phase stability and defect engineering in ferroelectric HfxZr1-xO2 heterostructuresGo to Link

Han, Changhyeon; Kwak, Been; Choi, Joonhyeok; Kwon, Hyucknam; Kwon, Ki-Ryun; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2025CitationMaterials Science in Semiconductor Processing, v.200, pp 1 - 7PublisherPergamon Press
SCIESCOPUS
Structure-modulated phase stability and defect engineering in ferroelectric HfxZr1-xO2 heterostructures(vol 200 ,109995 , 2025)Go to Link

Han, Changhyeon; Kwak, Been; Choi, Joonhyeok; Kwon, Hyucknam; Kwon, Ki-Ryun; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2026CitationMaterials Science in Semiconductor Processing, v.201, pp 1 - 1PublisherELSEVIER SCI LTD
SCIESCOPUS
Suppression of Gate-Induced-Drain-Leakage Utilizing Local Polarization in Ferroelectric-Gate Field-Effect Transistors for DRAM ApplicationsGo to Link

Kwak, Been; Lee, Kitae; Kim, Sihyun; Kwon, Daewoong

ArticleIssue Date2024CitationIEEE Electron Device Letters, v.45, no.5, pp 813 - 816PublisherInstitute of Electrical and Electronics Engineers
SCIESCOPUS
Synergistic Modulation of Polarization and Leakage Current in MPB-HZO Capacitors via TiO2 InterlayerGo to Linkopen access

Han, Changhyeon; Kwak, Been; Choi, Joonhyeok; Park, Sung-Wook; Yu, Dahye; Song, Minsuk; Choi, Rino; Kwon, Daewoong

ArticleIssue Date2025CitationAdvanced Electronic Materials, v.11, no.18, pp 1 - 9PublisherWILEY
SCIESCOPUS
The Impact of Through Silicon Metal(TSM) contact on Performance and thermal reliability in CFETGo to Link

Shin, Yunho; Kwak, Been; Myeong, Ilho; Kwon, Daewoong

ArticleIssue Date2025CitationIEEE Electron Device Letters, v.46, no.10, pp 1897 - 1900PublisherInstitute of Electrical and Electronics Engineers
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