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SCIESCOPUS

Experimental Analysis on the Interaction Between Interface Trap Charges and Polarization on the Memory Window of Metal-Ferroelectric-Insulator-Si (MFIS) FeFET Go to Link

Kim, Giuk; Choi, Hyojun; Lee, Sangho; Shin, Hunbeom; Lee, Sangmok; Nam, Yunseok; Kang, Hyunjun; Shin, Seokjoong; Kim, Hoon; Lim, Youngjin, et al.

ArticleIssue Date2024CitationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.71, no.11, pp 6627 - 6632PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

First Demonstration of Thermally Stable Zr:HfO2 Ferroelectrics Via Inserting AlN Interlayer Go to Link

Lee, Sangmok; Kim, Giuk; Lee, Sangho; Shin, Hunbeom; Lim, Youngjin; Kim, Kang; Kim, Do-Hyung; Oh, Il-Kwon; Ko Park, Sang-Hee; Ahn, Jinho, et al.

ArticleIssue Date2024CitationIEEE ELECTRON DEVICE LETTERS, v.45, no.9, pp 1578 - 1581PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS IN

SCIESCOPUS

Imprinted Antiferroelectric with Low Damage Process for High Performance Negative Capacitance NAND Flash Memory Go to Link

Lee, Sangho; Kim, Giuk; Nam, Yunseok; Jeong, Yeongseok; Kim, Taeho; Shin, Hunbeom; Lee, Sangmok; Ahn, Jinho; Jeon, Sanghun

ArticleIssue Date2025CitationIEEE Electron Device Letters, v.46, no.4, pp 572 - 575PublisherInstitute of Electrical and Electronics Engineers

SCOPUS

In-depth Analysis of the Hafnia Ferroelectrics as a Key Enabler for Low Voltage & QLC 3D VNAND beyond 1K Layers: Experimental Demonstration and Modeling Go to Link

Kim, Giuk; Choi, Hyojun; Shin, Hunbeom; Lee, Sangho; Lee, Sangmok; Nam, Yunseok; Jung, Minhyun; Myeong, Ilho; Kim, Kijoon; Woo, Jongho, et al.

ArticleIssue Date2024CitationDigest of Technical Papers - Symposium on VLSI Technology, pp 1 - 2

SCOPUS

Oxide Channel Ferroelectric NAND Device with Source-tied Covering Metal Structure: Wide Memory Window (14.3 V), Reliable Retention (> 10 years) and Disturbance Immunity (ΔVth ≤ 0.1 V) for QLC Operation Go to Link

Joh, Hongrae; Kim, Giuk; Ock, Jihye; Kim, Seungyeob; Lee, Sangmok; Lee, Sangho; Kim, Kwangsoo; Lim, Suhwan; Woo, Jongho; Kim, Wanki, et al.

ArticleIssue Date2025CitationTechnical Digest - International Electron Devices Meeting, pp 1 - 4

SCIESCOPUS

Stabilization of Morphotropic Phase Boundary in Hafnia via Microwave Low-Temperature Crystallization Process for Next-Generation Dynamic Random Access Memory Technology Go to Link

Shin, Hunbeom; Kim, Giuk; Lee, Sujeong; Choi, Hyojun; Lee, Sangho; Lee, Sangmok; Nam, Yunseok; Kang, Geonhyeong; Kim, Hyungjun; Ahn, Jinho, et al.

ArticleIssue Date2024Citationphysica status solidi (RRL) - Rapid Research Letters, v.18, no.9, pp 1 - 7PublisherWiley - VCH Verlag GmbH & CO. KGaA

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Browsing by Lee, SangmokAuthor

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