ScholarWorks@Hanyang University

Review of Scientific Instruments

Journal Title

  • Review of Scientific Instruments

ISSN

  • E 1089-7623 | P 0034-6748 | 0034-6748 | 1089-7623

Publisher

  • American Institute of Physics
  • AIP

Listed on(Coverage)

JCR1997-2019
SJR1999-2019
CiteScore2011-2019
SCI2010-2019
SCIE2010-2021
CC2016-2021
SCOPUS2017-2020
MEDLINE2016-2021
EMBASE2016-2020

Active

  • Active

    based on the information

    • SCOPUS:2020-10

Country

  • USA

Aime & Scopes

  • Review of Scientific Instruments (RSI) publishes novel advancements in scientific instrumentation, apparatuses, techniques of experimental measurement, and related mathematical analysis. Its content includes publication of regular articles, review articles, perspectives, tutorials, and notes on instruments covering all areas of science, including physics, chemistry, and biology. RSI regularly publishes conference proceedings of two conferences: the High-Temperature Plasma Diagnostics topical conference and the International Conference on Ion Sources. Special Topics may also be published on new developments or on recently held workshops or conferences in instrumentation. RSI covers timely reports on instrumentation within areas of research that include the following topics: /// Pump-Probe and Resonance Ionization Lasers; General Lasers /// Spectroscopy; Photon Optics and Detectors /// Atom/Molecule Traps, Manipulation and Detection /// Ion Optics and Acceleration; Particle Sources and Detectors; Nuclear Physics /// Fusion and Plasmas /// All Microscopy; Imaging Methods; Positioning Systems /// Condensed Matter; Materials /// Chemistry; Biology; Medicine /// Gravity; Geophysics; Astronomy and Astrophysics; Remote Sensing /// Electronics; Electromagnetic Technology; Microwaves; Power Supplies /// Thermometry; Thermal Diffusivity; Acoustics; Photothermal and Photoacoustic /// Sensors; Actuators; Positioning Devices; MEMS/NEMS /// General Instruments, Experimental Techniques or Analyses

Homepage

Article List

1 - 20 out of 20 results.

SCIESCOPUS
A wafer-like apparatus for two-dimensional measurement of plasma parameters and temperature distribution in low-temperature plasmasGo to Link

Lim, Yeong-Min; Eo, Hyundong; Kim, Kyung-Hyun; Lee, Moo-Young; Chung, Chin Wook

ArticleIssue Date2021CitationReview of Scientific Instruments, v.92, no.5, pp.1 - 11PublisherAmerican Institute of Physics Inc.
SCIESCOPUS
High resolution time- and angle-resolved photoemission spectroscopy with 11 eV laser pulsesGo to Link

Lee, Changmin; Rohwer, Timm; Sie, Edbert J.; Zong, Alfred; Baldini, Edoardo; Straquadine, Joshua; Walmsley, Philip; Gardner, Dillon; Lee, Young S.; Fisher, Ian R., et al.

ArticleIssue Date2020CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.91, no.4PublisherAMER INST PHYSICS
SCIESCOPUS
A monitoring device made of an anodic aluminum oxide template for plasma-induced charging potential measurements in the high-aspect-ratio trench structureGo to Link

Park, Ji-Hwan; Chung, Chin-Wook

ArticleIssue Date2018CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.89, no.11PublisherAMER INST PHYSICS
SCIESCOPUS
A microfabricated sun sensor using GaN-on-sapphire ultraviolet photodetector arraysGo to Link

Miller, Ruth A.; So, Hongyun; Chiamori, Heather C.; Suria, Ateeq J.; Chapin, Caitlin A.; Senesky, Debbie G.

ArticleIssue Date2016CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.87, no.9, pp.1 - 6PublisherAMER INST PHYSICS
SCIESCOPUS
Mapping the process dependent conductivity of carbon nanotube thin-films using a non-invasive contact probing systemGo to Link

Choi, Eunsuk; Lee, Seung-Beck

ArticleIssue Date2016CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.87, no.2, pp.1 - 7PublisherAMER INST PHYSICS
SCIESCOPUS
Probe diagnostics in the far scrape-off layer plasma of Korea Superconducting Tokamak Advanced Research tokamak using a sideband harmonic methodGo to Link

Kim, Dong-Hwan; Hong, Suk-Ho; Park, Il-Seo; Lee, Hyo-Chang; Kang, Hyun-Ju; Chung, Chin-Wook

ArticleIssue Date2015CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.86, no.12, pp.1 - 5PublisherAMER INST PHYSICS
SCIESCOPUS
Real-time dielectric-film thickness measurement system for plasma processing chamber wall monitoringGo to Link

Kim, Jin-Yong; Chung, Chin-Wook

ArticleIssue Date2015CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.86, no.12, pp.1 - 5PublisherAMER INST PHYSICS
SCIESCOPUS
Sensing of fluid viscoelasticity from piezoelectric actuation of cantilever flexural vibrationGo to Link

Park, Jeongwon; Jeong, Seongbin; Kim, Seung Joon; Park, Junhong

ArticleIssue Date2015CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.86, no.1, pp.1 - 6PublisherAMER INST PHYSICS
SCIESCOPUS
Two-dimensional-spatial distribution measurement of electron temperature and plasma density in low temperature plasmasGo to Link

Kim, Young-Cheol; Jang, Sung-Ho; Oh, Se-Jin; Lee, Hyo-Chang; Chung, Chin-Wook

ArticleIssue Date2013CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.84, no.5, pp.1 - 7PublisherAMER INST PHYSICS
SCIESCOPUS
Electrical test method using high density plasmas for high-end printed circuit boardsGo to Link

Oh, Se-Jin; Kim, Young-Cheol; Chung, Chin-Wook

ArticleIssue Date2012CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.83, no.1, pp.1 - 4PublisherAMER INST PHYSICS
SCIESCOPUS
Reconstruction of a scanned topographic image distorted by the creep effect of a Z scanner in atomic force microscopyGo to Link

Han, Cheolsu; Chung, Chung Choo

ArticleIssue Date2011CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.82, no.5, pp.1 - 8PublisherAMER INST PHYSICS
SCIESCOPUS
Note: Interpolation for evaluation of a two-dimensional spatial profile of plasma densities at low gas pressuresGo to Link

Oh, Se-Jin; Kim, Young-Chul; Chung, Chin-Wook

ArticleIssue Date2011CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.82, no.2, pp.1 - 2PublisherAMER INST PHYSICS
SCIESCOPUS
New interpolation algorithm for evaluation a spatial profile of plasma densities in radio frequency dischargesGo to Link

Oh, Se-Jin; Jang, Sung-Ho; Kim, Young-Cheol; Chung, Chin-Wook

ArticleIssue Date2010CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.81, no.5, pp.1 - 5PublisherAMER INST PHYSICS
SCIESCOPUS
Automatic approaching method for atomic force microscope using a Gaussian laser beamGo to Link

Han, Cheolsu; Lee, Haiwon; Chung, Choo

ArticleIssue Date2009CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.7, pp.1 - 7PublisherAIP Publishing
SCIESCOPUS
Microwave absorption measurements using a broad-band meanderline approachGo to Link

Tsai, Chih Cheih; Choi, Jin Taek; Cho, Sunglae; Lee, Seong Jae; Sarma, Bimal K.; Thompson, Cynthia K.; Chernyashevskyy, Oleksandr; Chernyashevskyy, Oleksandr; Ketterson, John B

ArticleIssue Date2009CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.2, pp.1 - 8PublisherAIP Publishing
SCIESCOPUS
Three point method to characterize low-pressure electronegative discharges using electrostatic probeGo to Link

Kang, Sung Young; Chung, Tae Hun; Chung, Kyu Sun

ArticleIssue Date2009CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.80, no.1, pp.1 - 5PublisherAIP Publishing
SCIESCOPUS
Deduction of edge electron density with multiply charged ions in ORNL volume-type electron cyclotron resonance ion sourceGo to Link

You, Hyun-Jong; Woo, Hyun-Jong; Chung, Kyu Sun; Liu, Yuan; Meyer, Fred Wolfgang; Lho, Taihyeop H.; Lee, Myoung Jae

ArticleIssue Date2008CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.79, no.2, pp.1 - 4PublisherAMER INST PHYSICS
SCIESCOPUS
Electrostatic instability of electron beams in a planar E x B amplifierGo to Link

Lee, Myoung-Jae; Lee, Hee J.; Chung, Kyu-Sun

ArticleIssue Date2008CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.79, no.2, pp.1 - 3PublisherAMER INST PHYSICS
SCIESCOPUS
Surface characterization of carbon nanotubes irradiated by electron beamGo to Link

Lee, Jeonggil; Kim, Euikwon; Jeon, Jaekyun; Lee, Yoonman; Kim, Jae-yong

ArticleIssue Date2008CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.79, no.2, pp.1 - 3PublisherAMER INST PHYSICS
SCIESCOPUS
Honeycomblike large area LaB6 plasma source for Multi-Purpose Plasma facility

Woo, Hyun-Jong; Chung, Kyu-Sun; You, Hyun-Jong; Lee, Myoung-Jae; Lho, Taihyeop; Choh, Kwon Kook; Yoon, Jung-Sik; Jung, Yong Ho; Lee, Bongju; Yoo, Suk Jae, et al.

ArticleIssue Date2007CitationREVIEW OF SCIENTIFIC INSTRUMENTS, v.78, no.10PublisherAMER INST PHYSICS
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