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Results 1-10 of 13 (Search time: 0.034 seconds).
Effect of Computational Lithography Parameters on the Organic Light-Emitting Diodes
Kim, Sang-Kon
Article
Issue Date
2016
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.8, pp.8496 - 8499
Publisher
AMER SCIENTIFIC PUBLISHERS
Impact of Process Parameters on a Combining Process of Block-Copolymer Self-Assembly with Electrohydrodynamic Jet Printing
Kim, Sang-Kon
Article
Issue Date
2017
Citation
SCIENCE OF ADVANCED MATERIALS, v.9, no.1, pp.42 - 47
Publisher
AMER SCIENTIFIC PUBLISHERS
Computational Study of Electrohydrodynamic Jet Printing with Block-Copolymer Inks
Kim, Sang-Kon
Article
Issue Date
2017
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.17, no.8, pp.5432 - 5435
Publisher
AMER SCIENTIFIC PUBLISHERS
Contact Hole Shrinking of Directed Self-Assembly and Its Application Based on Simulation Approach
Kim, Sang-Kon
Article
Issue Date
2015
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.15, no.10, pp.8183 - 8186
Publisher
AMER SCIENTIFIC PUBLISHERS
Impact of Plasmonic Parameters on 7-nm Patterning in Plasmonic Computational Lithography
Kim, Sang-Kon
Article
Issue Date
2018
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.18, no.10, pp.7124 - 7127
Publisher
AMER SCIENTIFIC PUBLISHERS
Line-Edge Roughness on Fin-Field-Effect-Transistor Performance for 7-nm and 5-nm Patterns
Kim, Sang-Kon
Article
Issue Date
2020
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.20, no.11, pp.6912 - 6915
Publisher
AMER SCIENTIFIC PUBLISHERS
Computational Study of Extreme Ultraviolet Vote-Taking Lithography for Defect Repair
Kim, Sang-Kon
Article
Issue Date
2020
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.20, no.8, pp.4994 - 4997
Publisher
AMER SCIENTIFIC PUBLISHERS
Prediction of Electric Field Effects on Defect-Free Self-Assembled Nano-Patterning of Block Copolymer
Kim, Sang-Kon
Article
Issue Date
2016
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.3, pp.2706 - 2709
Publisher
AMER SCIENTIFIC PUBLISHERS
Line-Edge Roughness Stochastics for 5-nm Pattern Formation in the Extreme Ultraviolet Lithography
Kim, Sang-Kon
Article
Issue Date
2019
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.19, no.8, pp.4657 - 4660
Publisher
AMER SCIENTIFIC PUBLISHERS
Extreme Ultraviolet Multilayer Defect Compensation in Computational Lithography
Kim, Sang-Kon
Article
Issue Date
2016
Citation
JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.16, no.5, pp.5415 - 5419
Publisher
AMER SCIENTIFIC PUBLISHERS
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Directed Self-Assembly
2
FinFET
2
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