Yoon, S.-Y.; Lee, S.-H.; Jo, D.-Y.; Kim, H.-M.; Kim, Y.; Kim, S.-K.; Channa, A.I.; Kim, Y.-H.; Kim, J.; Yang, H.
ArticleIssue Date2022CitationDigest of Technical Papers - SID International Symposium, v.53, no.1, pp.1357 - 1360PublisherJohn Wiley and Sons Inc