Seung-Han, K.[Seung-Han, K.]; Suk-Hyun, S.[Suk-Hyun, S.]; Jin-Ho, K.[Jin-Ho, K.]; Tae-Yoon, M.[Tae-Yoon, M.]; Chang-Wan, S.[Chang-Wan, S.]; Sung-Ho, H.[Sung-Ho, H.]; Jeon, J.W.[Jeon, J.W.]
ArticleIssue Date2008CitationIEEE International Conference on Industrial Informatics (INDIN), pp.967 - 972