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Bulk current injection test modeling using an equivalent circuit for 1.8V mobile ICs
- Authors
- Kwak S.[Kwak S.]; Jo J.[Jo J.]; Noh S.[Noh S.]; Lee H.[Lee H.]; Nah W.[Nah W.]; Kim S.[Kim S.]
- Issue Date
- 2012
- Citation
- cccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings, pp.565 - 568
- Journal Title
- cccc2012 Asia-Pacific Symposium on Electromagnetic Compatibility, APEMC 2012 - Proceedings
- Start Page
- 565
- End Page
- 568
- Abstract
- This paper shows a novel simulation method for bulk current injection (BCI) tests of I/O buffer circuits of mobile system memory. The simulation model consists of BCI probe, directional coupler, PCB, PKG, and IC. The proposed method is based on a behavioural I/O buffer model using a pulse generator as an input. A detailed simulation flow is introduced and validated through simulations performed on several injection probe loading conditions using a power decoupling capacitor and an on-chip decoupling capacitor. © 2012 IEEE.
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Related Researcher
- NAH, WAN SOO
- Information and Communication Engineering (Electronic and Electrical Engineering)