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Analytical models and algorithms for the efficient signal integrity verification of inductance-effect-prominent multicoupled VLSI circuit interconnects

Authors
Shin, SeongkyunEo, YungseonEisenstadt, WRShim, Jongin
Issue Date
Apr-2004
Publisher
Institute of Electrical and Electronics Engineers
Keywords
crosstalk; delay; glitch; ringing; signal integrity; transmission line; traveling-wave; traveling-wave-based waveform approximation (TWA); very large scale integration (VLSI) interconnects
Citation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, v.12, no.4, pp.395 - 407
Indexed
SCIE
SCOPUS
Journal Title
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Volume
12
Number
4
Start Page
395
End Page
407
URI
https://scholarworks.bwise.kr/erica/handle/2021.sw.erica/46606
DOI
10.1109/TVLSI.2004.825836
ISSN
1063-8210
Abstract
Novel signal integrity verification models and algorithms for inductance-effect-prominent RLC interconnect lines are developed by using a traveling-wave-based waveform approximation (TWA) technique. The multicoupled line responses are decoupled into the eigenmodes of the system in order to exploit the TWA technique. Then, the response signals are mathematically represented by the linear combination of each eigenmode response based on TWA, followed by reporting the signal integrity models and algorithms for the multicoupled lines. The signal integrity of VLSI circuit interconnects is complicatedly correlated with input signal switching-patterns, layout geometry, and termination conditions. It is shown that the technique can be efficiently employed for complicated multicoupled interconnect lines with various termination conditions and the signal transients based on the technique have excellent agreement with SPICE simulations. Thus, with the proposed technique, the switching-dependent signal delay, crosstalk, ringing, and glitches of the inductance-effect-prominent RLC interconnect lines can be accurately as well as efficiently determined.
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COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY > DEPARTMENT OF PHOTONICS AND NANOELECTRONICS > 1. Journal Articles
COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles

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EO, YUNG SEON
ERICA 공학대학 (SCHOOL OF ELECTRICAL ENGINEERING)
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