Choi, Sungju; Jang, Juntae; Kang, Hara; Baeck, Ju Heyuck; Bae, Jong Uk; Park, Kwon-Shik; Yoon, Soo Young; Kang, In Byeong; Kim, Dong Myong; Choi, Sung-Jin, et al.
ArticleIssue Date2017CitationIEEE ELECTRON DEVICE LETTERS, v.38, no.5, pp.580 - 583PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC