Kim, Hyeon-A; Kim, Jeong Oh; Hur, Jae Seok; Son, Kyoung-Seok; Lim, Jun Hyung; Cho, Johann; Jeong, Jae Kyeong
ArticleIssue Date2018CitationIEEE Transactions on Electron Devices, v.65, no.11, pp 4854 - 4860PublisherInstitute of Electrical and Electronics Engineers