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Degradation Characteristics of MgO Based Magnetic Tunnel Junction Caused by Surface Roughness of Ta/Ru Buffer LayersGo to Link

Lee, Jung Min; Choi, Chul Min; Sukegawa, Hiroaki; Lee, Jeong Yong; Mitani, Seiji; Song, Yun-Heub

ArticleIssue Date2016CitationJournal of Nanoscience and Nanotechnology, v.16, no.1, pp 654 - 657PublisherAmerican Scientific Publishers
SCISCIESCOPUSKCI
Effect of an Interface Mg Insertion Layer on the Reliability of a Magnetic Tunnel Junction based on a Co2FeAl Full-Heusler AlloyGo to Link

Lee, Jung-Min; Kil, Gyu Hyun; Lee, Gae Hun; Choi, Chul Min; Song, Yun-Heub; Sukegawa, Hiroaki; Mitani, Seiji

ArticleIssue Date2014CitationJournal of the Korean Physical Society, v.64, no.8, pp 1144 - 1149Publisher한국물리학회
SCISCIESCOPUS
Effect of Mg insertion on stress-induced resistance drift in MgO-based magnetic tunnel junctionsGo to Link

Choi, Chul Min; Oh, Young Taek; Lee, Jeong Yong; Sukegawa, Hiroaki; Mitani, Seiji; Song, Yun Heub

ArticleIssue Date2016CitationElectronics Letters, v.52, no.7, pp 531 - 532PublisherInstitute of Electrical Engineers
SCISCIESCOPUS
Investigation of ramped voltage stress to screen defective magnetic tunnel junctionsGo to Link

Choi, Chulmin; Sukegawa, Hiroaki; Mitani, Seiji; Song, Yunheub

ArticleIssue Date2018CitationSemiconductor Science and Technology, v.33, no.1PublisherInstitute of Physics Publishing
OTHER
Reliability modeling of Magnetic Tunnel Junction using MgO barrierGo to Link

Lee, Jungmin; Choi, Chulmin; Oh, Youngtek; Sukegawa, Hiroaki; Mitani, Seiji; Song, Yun Heub

ArticleIssue Date2014CitationExtended Abstracts of the 2014 International Conference on Solid State Devices and Materials,, pp.88 - 89PublisherThe Japan society of applied physics
SCISCIESCOPUS
Reliability of magnetic tunnel junctions with a spinel MgAl2O4 filmGo to Link

Choi, Chulmin; Sukegawa, Hiroaki; Mitani, Seiji; Song, Yun Heub

ArticleIssue Date2017CitationElectronics Letters, v.53, no.2, pp 119 - 120PublisherInstitute of Electrical Engineers
OTHER
Stochastic Model for SPICE simulation about Resistance Distribution of Magnetic Tunnel JunctionGo to Link

Kil, Gyuhyun; Choi, Juntae; Choi, Chulmin; Sukegawa, Hiroaki; Mitani, Seiji; Song, Yun Heub

ArticleIssue Date2014CitationExtended Abstracts of the 2014 International Conference on Solid State Devices and Materials, pp.86 - 87PublisherThe Japan society of applied physics
SCISCIESCOPUS
TDDB modeling depending on interfacial conditions in magnetic tunnel junctionsGo to Link

Choi, Chul-Min; Sukegawa, Hiroaki; Mitani, Seiji; Song, Yun-Heub

ArticleIssue Date2017CitationSemiconductor Science and Technology, v.32, no.10PublisherInstitute of Physics Publishing
SCISCIESCOPUS
Temperature dependence of reliability characteristics for magnetic tunnel junctions with a thin MgO dielectric filmGo to Link

Choi, Chul-Min; Oh, Young-Taek; Kim, Kyung-Jun; Park, Jin-Suk; Sukegawa, Hiroaki; Mitani, Seiji; Kim, Sung-Kyu; Lee, Jeong-Yong; Song, Yun-Heub

ArticleIssue Date2016CitationSemiconductor Science and Technology, v.31, no.7, pp 1 - 10PublisherInstitute of Physics Publishing
SCISCIESCOPUS
Time-dependent dielectric breakdown of MgO magnetic tunnel junctions and novel test methodGo to Link

Kim, Kyungjun; Choi, Chulmin; Oh, Youngtaek; Sukegawa, Hiroaki; Mitani, Seiji; Song, Yunheub

ArticleIssue Date2017CitationJapanese Journal of Applied Physics, v.56, no.4PublisherIOP Publishing Ltd
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