Sun, Jie; Mourey, Devin A.; Zhao, Dalong; Park, Sung Kyu; Nelson, Shelby F.; Levy, David H.; Freeman, Diane; Cowdery-Corvan, Peter; Tutt, Lee; Jackson, Thomas N.
ArticleIssue Date2008CitationIEEE ELECTRON DEVICE LETTERS, v.29, no.7, pp 721 - 723PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC