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A Highly Reliable Ferroelectric NAND Cell with Ultra-thin IGZO Charge Trap Layer: Trap Profile Engineering for Endurance and Retention Improvement Go to Link

Kang, Hyunjun; Joh, Hongrae; Kwak, Junhyeok; Kim, Giuk; Choi, Hyojun; Kim, Hoon; Park, Sanghyun; Seo, Kwangyou; Kim, Kwangsoo; Kim, Wanki, et al.

ArticleIssue Date2026CitationTechnical Digest - International Electron Devices Meeting, IEDM, pp 1 - 4PublisherInstitute of Electrical and Electronics Engineers Inc.

SCIESCOPUS

A Novel Ferroelectric NAND Cell Structure Featuring Ultrathin IGZO Charge Trap Layer for Superior Endurance and Retention Go to Link

Kang, Hyunjun; Joh, Hongrae; Kwak, Junhyeok; Kim, Giuk; Choi, Hyojun; Kim, Hoon; Park, Sanghyun; Seo, Kwangyou; Kim, Kwangsoo; Kim, Wanki, et al.

ArticleIssue Date2026CitationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.73, no.5, pp 3132 - 3139PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Band Engineering of Gate Interlayer for Low-voltage Operation and Enhanced Reliability in Gate-injection Type FeFETs Go to Link

Kim, Hoon; Kim, Giuk; Choi, Hyojun; Joh, Hongrae; Kang, Hyunjun; Park, Sanghyun; Seo, Kwangyou; Kim, Kwangsoo; Kim, Wanki; Ha, Daewon, et al.

ArticleIssue Date2026CitationIEEE ELECTRON DEVICE LETTERS, v.47, no.4, pp 728 - 731PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCIESCOPUS

Comparative efficacy of bariatric endoscopic procedures in the treatment of morbid obesity: a systematic review and network meta-analysis Go to Link

Jung, Sung Hoon; Yoon, Jai Hoon; Choi, Hyuk Soon; Nam, Seung-Joo; Kim, Kyoung Oh; Kim, Hoon; Kim, Jung-Wook; Sohn, Won; Hyun, Yil Sik; Park, Chan Hyuk, et al.

ArticleIssue Date2020CitationEndoscopy, v.52, no.11, pp 940 - 954PublisherGeorg Thieme Verlag

SCIESCOPUSKCI

Current Status of Neurosurgical and Neurointensive Care Units in Korea : A Brief Report on Nationwide Survey Results Go to Link open access

Jo, Kwang Wook; Kim, Hoon; Yoo, Do Sung; Hyun, Dong-Keun; Cheong, Jin Hwan; Park, Hae-Kwan; Park, Bong Jin; Cho, Byung Moon; Kim, Young Woo; Kim, Tae Hee, et al.

ArticleIssue Date2020CitationJOURNAL OF KOREAN NEUROSURGICAL SOCIETY, v.63, no.4, pp.519 - 531PublisherKOREAN NEUROSURGICAL SOC

SCOPUS

Decoupling and Quantifying Polarization and Trap Charges in MIFIS FeNAND: Insights into Charge Dynamics and Reliability Go to Link

Joh, Hongrae; Kang, Hyunjun; Kwak, Junhyeok; Kim, Giuk; Choi, Hyojun; Kim, Hoon; Park, Sanghyun; Seo, Kwangyou; Kim, Kwangsoo; Kim, Wanki, et al.

ArticleIssue Date2026Citation2025 IEEE International Electron Devices Meeting (IEDM), pp 1 - 4PublisherIEEE

SCIESCOPUS

Enhancement of performance and reliability in MOSFETs via high-pressure microwave annealing Go to Link

Kang, Geonhyeong; Shin, Hunbeom; Kim, Seungyeob; Zhang, Lingwei; Kim, Giuk; Lee, Sujeong; Nam, Yunseok; Kim, Chaeheon; Kim, Hoon; Ahn, Jinho, et al.

ArticleIssue Date2025CitationJournal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures, v.43, no.1, pp 1 - 6PublisherAmerican Institute of Physics

SCIESCOPUS

Experimental Analysis and Mathematical Modeling of Program Efficiency in Gate-Side Injection Type FeFETs Depending on the Gate Interlayer Go to Link

Kim, Giuk; Kim, Taeho; Choi, Hyojun; Shin, Seokjoong; Kim, Hoon; Park, Sanghyun; Seo, Kwangyou; Kim, Kwangsoo; Kim, Wanki; Ha, Daewon, et al.

ArticleIssue Date2025CitationIEEE Transactions on Electron Devices, v.72, no.9, pp 4896 - 4901PublisherInstitute of Electrical and Electronics Engineers

SCIESCOPUS

Experimental Analysis on the Interaction Between Interface Trap Charges and Polarization on the Memory Window of Metal-Ferroelectric-Insulator-Si (MFIS) FeFET Go to Link

Kim, Giuk; Choi, Hyojun; Lee, Sangho; Shin, Hunbeom; Lee, Sangmok; Nam, Yunseok; Kang, Hyunjun; Shin, Seokjoong; Kim, Hoon; Lim, Youngjin, et al.

ArticleIssue Date2024CitationIEEE TRANSACTIONS ON ELECTRON DEVICES, v.71, no.11, pp 6627 - 6632PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC

SCOPUS

Exploring FeFET Degradation Mechanisms: Mid-Interlayer as a Viable Solution for Stable Retention, Disturb Immunity, and Low Vth Variation Go to Link

Kim, Giuk; Lee, Sangho; Choi, Hyojun; Kim, Hoon; Shin, Seokjoong; Park, Sanghyun; Seo, Kwangyou; Kim, Kwangsoo; Kim, Wanki; Ahn, Jinho, et al.

ArticleIssue Date2025CitationDigest of Technical Papers - Symposium on VLSI Technology, pp 1 - 3

SCIESCOPUS

Optimizing De-trap Pulses in Gate-injection Type Ferroelectric NAND Cells to Minimize Read After Write Delay Issue Go to Link

Kim, Giuk; Choi, Hyojun; Cho, Hongrae; Lee, Sangho; Shin, Hunbeom; Kang, Hyunjun; Kim, Hoon; Shin, Seokjoong; Park, Seonjae; Kwon, Sunseong, et al.

ArticleIssue Date2024CitationIEEE Electron Device Letters, v.45, no.12, pp 2359 - 2362PublisherInstitute of Electrical and Electronics Engineers

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Browsing by Kim, HoonAuthor

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