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Effect of E-Beams Irradiation Dose on the Sensing Properties of Pt-Functionalized Reduced Graphene Oxides Following Annealing of the 6 nm-Thick Pt Layer Go to Link

Kwon, Yong Jung; Mhzaei, Ali; Na, Han Gil; Kong, Sung Yong; Choi, Myung Sik; Bang, Jae Hoon; Lee, Jaegab; Kane, Inpil; Kim, Sang Sub; Kim, Hyoun Woo

ArticleIssue Date2017Citation대한금속·재료학회지, v.55, no.7, pp 492 - 502Publisher대한금속·재료학회

SCIESCOPUS

Effect of O-2 Gas during Inductively Coupled O-2/Cl-2 Plasma Etching of Mo and HfO2 for Gate Stack Patterning Go to Link

Jung, Ho Young; Lee, Hag Joo; Kwon, Bong Soo; Park, Jung Ho; Lee, Chiyoung; Ahn, Jinho; Lee, Jaegab; Lee, Nae-Eung

ArticleIssue Date2008CitationJapanese Journal of Applied Physics, v.47, no.8, pp 6938 - 6942PublisherIOP Publishing Ltd

SCIESCOPUS

Effects of interfacial layer-by-layer nanolayers on the stability of the Cu TSV:Diffusion barrier, adhesion, conformal coating, and mechanical property Go to Link

Jeong, Daekyun; Abdur, Rahim; Joo, Young-Chang; Jang, Jae-il; Cha, Pil Ryung; Kim, Jiyoung; Min, Kyeong-Sik; Lee, Jaegab

ArticleIssue Date2018CitationMATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING, v.83, pp.33 - 41PublisherELSEVIER SCI LTD

SCOPUS

Fabrication and characteristics of TiO2 nanotubes using atomic layer chemical vapor deposition (ALCVD)Go to Link

Cha, Dongky; Lee, Bongki; Kim, Moon J; Kim, Jiyoung; Won, Sanghee; Shin, Hyun Jung; Lee, Jaegab; Sung, Myung Mo

ArticleIssue Date2007CitationECS Transactions, v.3, no.15, pp 227 - 232PublisherElectrochemical Society, Inc.

SCIESCOPUS

Fabrication of Cu/Co bilayer gate electrodes using selective chemical vapor deposition and soft lithographic patterning Go to Link

Yang, Heejung; Lee, Jang-Sik; Kim, Sihyeong; Ko, Yeonkyu; Shin, Hyunjung; Lee, Jaegab; Kim, Chul S.; Sung, Myung Mo; Bae, Yangho; Cho, Beomseok, et al.

ArticleIssue Date2006CitationJournal of Applied Physics, v.100, no.11PublisherAmerican Institute of Physics

SCIESCOPUS

Iodine-catalyzed chemical vapor deposition of Cu on MPTMS monolayer surface in a low deposition temperature regime Go to Link

Park, Hae Jin; Shin, Hyunjung; Jung, Hyun Suk; Kim, C; Sung, Myung Mo; Lee, CM; Soh, Hoe Sup; Lee, Jaegab

ArticleIssue Date2007CitationSurface and Coatings Technology, v.201, no.22-23, pp 9432 - 9436PublisherElsevier BV

SCISCIESCOPUS

Mechanical and electrical stability of PEDOT: PTS and Au source/drain electrodes for bottom contact OTFTs on plastic films under bending conditions Go to Link

Abdur, Rahim; Lee, Young Kyu; Jeong, Kyunghoon; Nam, Ho-Seok; Kim, Young-Ho; Kim, Jiyoung; Lee, Jaegab

ArticleIssue Date2015CitationOrganic Electronics, v.26, pp 8 - 14PublisherElsevier BV

SCISCIESCOPUS

Memory Effect of Low-Temperature Processed ZnO Thin-Film Transistors Having Metallic Nanoparticles as Charge Trapping Elements Go to Link

Park, Young-Su; Kim, Soo-Jin; Lyu, Si-Hoon; Lee, Byoung Hoon; Sung, Myung Mo; Lee, Jaegab; Lee, Jang-Sik

ArticleIssue Date2012CitationJournal of Nanoscience and Nanotechnology, v.12, no.2, pp 1344 - 1347PublisherAmerican Scientific Publishers

SCISCIESCOPUS

Selected Peer-Reviewed Articles from the International Union of Materials Research Societies-International Conference on Electronic Materials 2010 (IUMRS-ICEM 2010)Go to Link

Kim, Dojin; Lee, Jaegab; Cho, Gil-Won; Ju, Jung Hoon; Lee, Jeon Kuk; Kim, JiSoon; Hong, Soon-Ku; Baik, UnKyu; Park, Won-Il; Jang, Si-Yul

ArticleIssue Date2012CitationJournal of Nanoscience and Nanotechnology, v.12, no.2, pp 1128 - 1130PublisherAmerican Scientific Publishers

SCIESCOPUSKCI

Selective vapor-phase deposition of conductive poly(3,4-ethylenedioxythiophene) thin films on patterned FeCl3 formed by microcontact printing Go to Link

Lee, Bo H.; Cho, Yeon H.; Shin, Hyunjung; Kim, Jinyeol; Lee, Jaegab; Lee, Haiwon; Sung, Myung M.

ArticleIssue Date2006CitationBulletin of the Korean Chemical Society, v.27, no.10, pp 1633 - 1637Publisher대한화학회

SCISCIESCOPUS

Synthesis of highly conductive cobalt thin films by LCVD at atmospheric pressure Go to Link

Jeong, Kyunghoon; Lee, Jiwon; Byun, Injae; Seong, Myung-jun; Park, Jongsoo; Kim, Hyoun Woo; Kim, Moon J.; Kim, Jae-Hun; Lee, Jaegab

ArticleIssue Date2017CitationMaterials Science in Semiconductor Processing, v.68, pp 245 - 251PublisherPergamon Press

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