Han, Changhyeon; Kwon, Ki Ryun; Jeong, Soi; Kwak, Been; Yim, Jiyong; Park, Eun Chan; You, Ji Won; Choi, Rino; Kwon, Daewoong
ArticleIssue Date2025CitationIEEE Transactions on Electron Devices, v.72, no.2, pp 635 - 639PublisherInstitute of Electrical and Electronics Engineers