Jin, J[Jin, Jahoon]; Kim, S[Kim, Seok]; Jin, X[Jin, Xuefan]; Kim, SH[Kim, Sang-Hoon]; Chun, JH[Chun, Jung-Hoon]
ArticleIssue Date2018CitationIEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, v.26, no.3, pp.522 - 530PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC