Seo, Hyeongmin; Han, Jiyun; Kim, Kyungmin; Lim, Baekjin; Shin, Eunseok; Choi, Youngdon; Ko, Hyungjong; Choi, Jung-Hwan; Lee, Sang-Hyun; Yoo, Changsik, et al.
ArticleIssue Date2023CitationIEEE Transactions on Circuits and Systems II: Express Briefs, v.70, no.2, pp 411 - 415PublisherInstitute of Electrical and Electronics Engineers