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IEEE Journal of Solid-State Circuits

Journal Title

  • IEEE Journal of Solid-State Circuits

ISSN

  • E 1558-173X | P 0018-9200

Publisher

  • Institute of Electrical and Electronics Engineers

Listed on(Coverage)

JCR 1997-2019
SJR 1999-2019
CiteScore 2011-2019
SCI 2010-2019
SCIE 2010-2021
CC 2016-2021
SCOPUS 2017-2020

Active

  • Active

    based on the information

    • SCOPUS:2020-10

Country

  • USA

Aime & Scopes

  • The IEEE Journal of Solid-State Circuits publishes papers each month in the broad area of solid-state circuits with particular emphasis on transistor-level design of integrated circuits. It also provides coverage of topics such as circuits modeling, technology, systems design, layout, and testing that relate directly to IC design. Integrated circuits and VLSI are of principal interest; material related to discrete circuit design is seldom published. Experimental verification is strongly encouraged.

Homepage

Article List

1 - 13 out of 13 results.

SCIESCOPUS
A Baseline-Tracking Single-Channel I/Q Impedance Plethysmogram IC for Neckband-Based Blood Pressure and Cardiovascular MonitoringGo to Link

Park, Chan Sam; Kim, Hyunjoong; Lee, Kwangmuk; Keum, Dae Sik; Jang, Dong Pyo; Kim, Jae Joon

ArticleIssue Date2023CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.58, no.7, pp 2040 - 2052PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A 7-nm Four-Core Mixed-Precision AI Chip With 26.2-TFLOPS Hybrid-FP8 Training, 104.9-TOPS INT4 Inference, and Workload-Aware ThrottlingGo to Link

Lee, Sae Kyu; Agrawal, Ankur; Silberman, Joel; Ziegler, Matthew; Kang, Mingu; Venkataramani, Swagath; Cao, Nianzheng; Fleischer, Bruce; Guillorn, Michael; Cohen, Matthew, et al.

ArticleIssue Date2022CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.57, no.1, pp.182 - 197PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
An Output Bandwidth Optimized 200-Gb/s PAM-4 100-Gb/s NRZ Transmitter With 5-Tap FFE in 28-nm CMOSGo to Link

Wang, Zhongkai; Choi, Minsoo; Lee, Kyoungtae; Park, Kwanseo; Liu, Zhaokai; Biswas, Ayan; Han, Jaeduk; Du, Sijun; Alon, Elad

ArticleIssue Date2021CitationIEEE Journal of Solid-State Circuits, v.57, no.1, pp.1 - 11PublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
A Low-Area and Fully Nonlinear 10-Bit Column Driver With Low-Voltage DAC and Switched-Capacitor Amplifier for Active-Matrix DisplaysGo to Link

Kim, Jong Seok; Yoon, Jin-O; Choi, Byong-Deok

ArticleIssue Date2021CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.56, no.2, pp.488 - 500PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Highly Integrated Guidewire Ultrasound Imaging System-on-a-ChipGo to Linkopen access

Lim, Jaemyung; Tekes, Coskun; Arkan, Evren F.; Rezvanitabar, Ahmad; Degertekin F. Levent; Ghovanloo, Maysam

ArticleIssue Date2020CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.55, no.5, pp.1310 - 1323PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A Physical Unclonable Function With Bit Error Rate < 2.3 $\times$ 10(-8) Based on Contact Formation Probability Without Error Correction CodeGo to Link

Jeon, Duhyun; Baek, Jong Hak; Kim, Yong-Duck; Lee, Jaeseong; Kim, Dong Kyue; Choi, Byong-Deok

ArticleIssue Date2020CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.55, no.3, pp.805 - 816PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A Mixed-Signal RISC-V Signal Analysis SoC Generator With a 16-nm FinFET InstanceGo to Link

Bailey, Steven; Rigge, Paul; Han, Jae duk; Lin, Richard; Chang, Eric Y; Mao, Howard; Wang, Zhongkai; Markley, Chick; Izraelevitz, Adam M.; Wang, Angie, et al.

ArticleIssue Date2019CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.54, no.10, pp.2786 - 2801PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A Real-Time, 1.89-GHz Bandwidth, 175-kHz Resolution Sparse Spectral Analysis RISC-V SoC in 16-nm FinFETGo to Linkopen access

Wang, Angie; Bae, Woorham; Han, Jae duk; Bailey, Stevo; Ocal, Orhan; Rigge, Paul; Wang, Zhongkai; Ramchandran, Kannan; Alon, Elad; Nikolic, Borivoje

ArticleIssue Date2019CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.54, no.7, pp.1993 - 2008PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A 3.9-kHz Frame Rate and 61.0-dB SNR Analog Front-End IC With 6-bit Pressure and Tilt Angle Expressions of Active Stylus Using Multiple-Frequency Driving Method for Capacitive Touch Screen PanelsGo to Link

An, Jae-Sung; Han, Sang-Hyun; Kim, Ju Eon; Yoon, Dong-Hyun; Kim, Young-Hwan; Hong, Han-Hee; Ye, Jae-Hun; Jung, Sung-Jin; Lee, Seung-Hwan; Jeong, Ji-Yong, et al.

ArticleIssue Date2018CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.53, no.1, pp.187 - 203PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A 40-to-56 Gb/s PAM-4 Receiver With Ten-Tap Direct Decision-Feedback Equalization in 16-nm FinFETGo to Link

Im, Jay; Freitas, Dave; Roldan, Arianne Bantug; Casey, Ronan; Chen, Stanley; Chou, Chuen-Huei Adam; Cronin, Tim; Geary, Kevin; McLeod, Scott; Zhou, Lei, et al.

ArticleIssue Date2017CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.52, no.12, pp.3486 - 3502PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Design Techniques for a 60-Gb/s 288-mW NRZ Transceiver With Adaptive Equalization and Baud-Rate Clock and Data Recovery in 65-nm CMOS TechnologyGo to Link

Han, Jae duk; Sutardja, Nicholas; Lu, Yue; Alon, Elad

ArticleIssue Date2017CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.52, no.12, pp.3474 - 3485PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
Design Techniques for a 60 Gb/s 173 mW Wireline Receiver Frontend in 65 nm CMOS TechnologyGo to Link

Han, Jae duk; Lu, Yue; Sutardja, Nicholas; Jung, Kwangmo; Alon, Elad

ArticleIssue Date2016CitationIEEE JOURNAL OF SOLID-STATE CIRCUITS, v.51, no.4, pp.871 - 880PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
SCIESCOPUS
A Q-Modulation Technique for Efficient Inductive Power TransmissionGo to Linkopen access

Kiani, Mehdi; Lee, Byung hun; Yeon, Pyungwoo; Ghovanloo, Maysam

ArticleIssue Date2015CitationIEEE Journal of Solid-State Circuits, v.50, no.12, pp.2839 - 2848PublisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
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