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1. Journal Articles(COLLEGE OF ENGINEERING SCIENCES > SCHOOL OF ELECTRICAL ENGINEERING > 1. Journal Articles)4,083

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Collection's Items (Sorted by Issue Date in Descending order): 1381 to 1400 of 4083

SCIESCOPUS
Modeling and Applications of a Family of Five-Degree-of-Freedom Parallel Mechanisms With Kinematic and Actuation RedundancyGo to Link

Kang, Long; Kim, Wheekuk; Yi, Byung-Ju

ArticleIssue Date2018CitationJournal of Mechanisms and Robotics, v.10, no.5, pp 1 - 16PublisherAmerican Society of Mechanical Engineers
SCIESCOPUS
Motion optimization of human body for impulse-based applicationsGo to Link

Imran, Abid; Yi, Byung-Ju

ArticleIssue Date2018CitationIntelligent Service Robotics, v.11, no.4, pp 323 - 333PublisherSpringer Verlag
SCISCIESCOPUS
Finding minimum node separators: A Markov chain Monte Carlo methodGo to Link

Lee, Joohyun; Kwak, Jaewook; Lee, Hyang-Won; Shroff, Ness B.

ArticleIssue Date2018CitationRELIABILITY ENGINEERING & SYSTEM SAFETY, v.178, pp 225 - 235PublisherELSEVIER SCI LTD
OTHER
Non-Orthogonal Multiple Access with Coordinated Transmission Aided by Buffers in End User and RelayGo to Link

Choi, Yunsung; Kim, Dongwoo

ArticleIssue Date2018CitationInternational Conference on Advanced Technologies for Communications, v.2018, pp 10 - 14PublisherIEEE Computer Society
SCIESCOPUS
Evolution Consistency Based Decomposition for Coonerative CoevolutionGo to Linkopen access

YANG, QIANG; CHEN, WEI-NENG; ZHANG, JUN

ArticleIssue Date2018CitationIEEE Access, v.6, pp 51084 - 51097PublisherInstitute of Electrical and Electronics Engineers Inc.
SCOPUS
An AutomationML/OPC UA-based Industry 4.0 Solution for a Manufacturing System

Ye, X.; Hong, S.H.

ArticleIssue Date2018CitationIEEE International Conference on Emerging Technologies and Factory Automation, ETFA, v.2018-September, pp.543 - 550PublisherInstitute of Electrical and Electronics Engineers Inc.
OTHER
Short-Term and Long-Term Dielectric Characteristics of Molded Compound According to Various Portion of Alumina Trihydrate Micro-FillerGo to Link

Hwang, Ryul; Na, Jin yong; Koo, Jae hong; Kang, Jong sung; Lee, Bang wook

ArticleIssue Date2018Citation2018 Condition Monitoring and Diagnosis, CMD 2018 - ProceedingsPublisherInstitute of Electrical and Electronics Engineers Inc.
SCIESCOPUS
A new brushless wound rotor synchronous machine using a special stator winding arrangementGo to Link

Hussain, Asif; Kwon, Byung-il

ArticleIssue Date2018CitationELECTRICAL ENGINEERING, v.100, no.3, pp.1797 - 1804PublisherSPRINGER
SCIESCOPUS
Wide speed range operation of permanent magnet vernier machinesGo to Link

Arif, A.; Baloch, N.; Kwon, B. I.

ArticleIssue Date2018CitationELECTRONICS LETTERS, v.54, no.18, pp.1070 - 1071PublisherINST ENGINEERING TECHNOLOGY-IET
SCOPUS
Writing monolithic integrated circuits on a two-dimensional semiconductor with a scanning light probeGo to Link

Seo, Seung young; Park, Jaehyun; Park, Jewook; Song, Kyung; Cha, Soonyoung; Sim, Sangwan; Choi, Si young; Yeom, Han woong; Choi, Hyunyong; Jo, Moon ho

ArticleIssue Date2018CitationNature Electronics, v.1, no.9, pp.512 - 517PublisherNATURE PUBLISHING GROUP
SCISCIESCOPUS
A 2.5–5.6 GHz Subharmonically Injection-Locked All-Digital PLL With Dual-Edge Complementary Switched InjectionGo to Link

Cho, Sung-Yong; Kim, Sungwoo; Choo, Min-Seong; Ko, Han-Gon; Lee, Jinhyung; Bae, Woorham; Jeong, Deog-Kyoon

ArticleIssue Date2018CitationIEEE Transactions on Circuits and Systems I: Regular Papers, v.65, no.9, pp 2691 - 2702PublisherInstitute of Electrical and Electronics Engineers
SCISCIESCOPUS
A Dynamic Logistic Dispatching System With Set-Based Particle Swarm OptimizationGo to Link

Jia, Ya-Hui; Chen, Wei-Neng; Gu, Tianlong; Zhang, Huaxiang; Yuan, Huaqiang; Lin, Ying; Yu, Wei-Jie; Zhang, Jun

ArticleIssue Date2018CitationIEEE Transactions on Systems, Man, and Cybernetics: Systems, v.48, no.9, pp 1607 - 1621PublisherIEEE Advancing Technology for Humanity
KCI
Design and Analysis of a Material Efficient Sinusoidal Consequent-Pole High-Speed Axial-Flux MachineGo to Link

Kumar, Sunil; 권병일

ArticleIssue Date2018Citation전기전자학회논문지, v.22, no.3, pp.759 - 766Publisher한국전기전자학회
OTHER
Investigation of Arc Behavior in HVDC LC Resonance Circuit Breaker Using Flexible Pulsed DC-SourceGo to Link

Park, Kyu hoon; Lee, Ho yun; Asif, Mansoor; Lee, Bang wook

ArticleIssue Date2018Citation2018 Condition Monitoring and Diagnosis, CMD 2018 - ProceedingsPublisherInstitute of Electrical and Electronics Engineers Inc.
OTHER
Influence on Configuration of Contact Support with Slits for Axial Magnetic Field Vacuum InterrupterGo to Link

Na, Jin yong; Cha, Young kwang; Koo, Jae hong; Shin, Tea yong; Seo, Cheong won; Lee, Bang wook

ArticleIssue Date2018CitationProceedings - International Symposium on Discharges and Electrical Insulation in Vacuum, ISDEIV, v.2, pp 659 - 662PublisherInstitute of Electrical and Electronics Engineers Inc.
KCI
Slip-Mode Frequency Shift 단독운전 검출 기법의 정상상태 전력 품질 개선Go to Link

김동욱; 김성민

ArticleIssue Date2018Citation전기전자학회논문지, v.22, no.3, pp 539 - 547Publisher한국전기전자학회
SCIESCOPUS
Determination of effective parameters for diagnosis and classification of air-conditioning refrigerant noise by logistic regressionGo to Link

Kim, Yong-Dae; Yoo, Kook-Hyun; Oh, Jae-Eung

ArticleIssue Date2018CitationNOISE CONTROL ENGINEERING JOURNAL, v.66, no.5, pp 415 - 423PublisherINST NOISE CONTROL ENGINEERING
SCIESCOPUS
U-shaped stacked structure monolithic transformer for efficiency improvementGo to Link

Kang, Sungyoon; Kim, Minchul; Kim, Junghyun

ArticleIssue Date2018CitationMICROWAVE AND OPTICAL TECHNOLOGY LETTERS, v.60, no.9, pp 2325 - 2330PublisherWILEY
SCISCIESCOPUS
A single event upset tolerant latch designGo to Link

Wang, Haibin; Dai, Xixi; Wang, Yangsheng; Nofal, Issam; Cai, Li; Shen, Zicai; Sun, Wanxiu; Bi, Jinshun; Li, Bo; Guo, Gang, et al.

ArticleIssue Date2018CitationMICROELECTRONICS RELIABILITY, v.88-90, pp 909 - 913PublisherPERGAMON-ELSEVIER SCIENCE LTD
SCISCIESCOPUS
Failure signature analysis of power-opens in DDR3 SDRAMsGo to Link

Li, Tan; Lee, Hosung; Bak, Geunyong; Baeg, Sanghyeon

ArticleIssue Date2018CitationMICROELECTRONICS RELIABILITY, v.88-90, pp 277 - 281PublisherPERGAMON-ELSEVIER SCIENCE LTD
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