An, J.-S.; Han, S.-H.; Kim, J.E.; Yoon, D.-H.; Kim, Y.-H.; Hong, H.-H.; Ye, J.-H.; Jung, S.-J.; Lee, S.-H.; Jeong, J.-Y., et al.
ArticleIssue Date2017CitationDigest of Technical Papers - IEEE International Solid-State Circuits Conference, v.60, pp 168 - 169PublisherInstitute of Electrical and Electronics Engineers Inc.