Jeon, Woongsun; Georgiou, Anastasis; Sun, Zongxuan; Rothamer, David A.; Kim, Kenneth; Kweon, Chol-Bum; Rajamani, Rajesh
ArticleIssue Date2023CitationIEEE Transactions on Instrumentation and Measurement, v.72, pp 1 - 1PublisherInstitute of Electrical and Electronics Engineers Inc.